UT8SD4MQ2G72 18GB DDR4

Part Number Flight Grade TID krad(Si) Event Rate Density Configuration Speed Supply Voltage Package
UT8SD4MQ2G72 PEM INST-001 Level 2 100 4,000 yrs MTTF GEO (Adams 90%, 100 mil Al) 16GB + 2GB ECC 2G x 72 2400 MT/s @CL 18-18-18 1.2V 266-PBGA 1mm Pitch

The UT8SD4MQ2G72 is an ultra-high-density, space-grade 18GB (16GB + 2GB ECC) DDR4 DRAM volatile memory.

UT8SD4MQ2G72 18GB DDR4

Screened and qualified to the NASA PEM INST-001 requirements for plastic encapsulated microcircuits.

Features:

  • PC4-19200 UDIMM equivalent 
  • 18 GB Density (16GB + 2GB ECC)
  • 2Gx72 configuration (9 die)
  • Dedicated RESET each die
  • Supports die SEFI recovery & maintain module availability
  • Command/Address (CA) parity
  • Data bus inversion supported
  • Up to 2400 MT/s data rate
  • Maximum Power Savings Mode supported
  • Low power auto self refresh
  • Thermally enhanced packaging technology
  • 1.2V VDD & VDDQ
  • 2.5V VPP

Applications:

  • High-performance computing
  • Processing data storage for AI & ML
  • RF signal processing data storage
  • Buffering data for SSDs
  • Operational Environment: Target Temp Range: -40°C to +125°C
  • Target TID: 100 krad(Si)
  • SEL: 40,000 yrs MTTF GEO; >1,500,00 yrs MTTF LEO 
    • Part Characterized from 37 to 82 LET 
  • SEU: 8.93E-12 errors/bit-day (LEO)
  • SEFI: High current: 1.04E-4 events/device-day (LEO)
    • Dynamic:  5.87E-4 events/device-day (LEO) 

Physical:

  • 266-pin (14x19) PBGA, 15 mm x 20 mm x 2.3 mm, 1.5gm
  • 1.0 mm pitch 

Power:

  • 200mW burst READ/WRITE power per die
  • est. ThetaJ-C < 5 °C/W  

 Flight Levels:

  • NASA EEE-INST-002 (PEM-INST-001) Level 2 
  • Frontgrade Space PEM QD

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