ADEPT Notification Library
ADEPT Name | Model/Part Number | Notification Title |
---|---|---|
SPO-2018-PA-0002 | UT04VS33P UT04VS50P |
tR_VDD: Cold Startup + tRP: Cold T + low VDD |
SPO-2020-PA-0007 | UT32M0R500 | SMD 5962-17212 UPDATE; PIN C4 DESCRIPTION CHANGE; SER AND SEP CHANGE; I2C AND ADC SPECIFICATION AND VALUE UPDATES; PIN M2 TYPO CORRECTION |
SPO-2013-PA-0001 | UT54ALVC2525 | TID method change to DRR for device type 02-only |
SPO-2014-PCN-0002 | UT54LVDM228 | Theta-JC and PD Improvements |
SPO-2012-PCN-0003 | UT54LVDM328 | Package dimension/drawing changes |
SPO-2014-PCN-0001 | UT54LVDM328 | Theta-JC and PD Improvements |
SPO-2012-PCN-0001 | UT54LVDS217 | Package dimension/drawing changes |
SPO-2012-PCN-0002 | UT54LVDS218 | Package dimension/drawing changes |
SPO-2015-PA-0001 | UT63M143 UT63M147 UT69151-SuMMIT-DXE UT69151-SuMMIT-RTE UT69151-SuMMIT-XTE MIL-STD-1553 |
The objective of this product advisory is to inform MIL-STD-1553 circuit designers of lessons learned during a residual voltage investigation and to offer some transformer selection recommendations to minimize residual voltage. |
SPO-2015-PA-0001A | UT63M143 UT63M147 UT69151-SuMMIT-DXE UT69151-SuMMIT-RTE UT69151-SuMMIT-XTE MIL-STD-1553 |
This amendment adds BTTC as an approved transformer supplier for optimal compatibility with the Frontgrade 1553 Transceiver. The results of the BTTC compatibility study are included. A final recommendation for leakage inductance screening limits is defined. |
SPO-2018-D-0002 | UT63M143 UT63M147 |
End Of Life For 24-lead Flatpack With Floating Lid And Replacement With New Package Containing A Grounded Lid For Dual Channel Mil-std-1553 Transceivers |
SPO-2018-PCN-0001 | UT63M147 | AFFIRMATION of migrated UT63M147 RADIATION HARDNESS ASSURANCE margin over its obsolete predecessor |
SPO-2013-PCN-0006 | UT69151-SuMMIT-DXE | SEE Limits Clarification to device types 04 |
SPO-2013-PCN-0002 | UT69151-SuMMIT-RTE | Updated new package tolerances dimensions A |
SPO-2014-D-0002A | UT69151-SuMMIT-XTE | Notification of Internal Memory Obsolescence and Migration |
SPO-2014-D-0002B | UT69151-SuMMIT-XTE | Notification of Internal Memory Obsolescence and Migration |
SPO-2014-PIN-0003 | UT69151-SuMMIT-XTE | Addition of Case Outline Z for 139-CPGA |
SPO-2014-PIN-0003A | UT69151-SuMMIT-XTE | Amendment A has corrected Dimensions for Case Z for 139-CPGA |
SPO-2012-PCN-0005 | UT69151-SuMMIT-XTE | Timing parameter limit changes to SuMMIT XTE |
SPO-2013-PCN-0001 | UT69151-SuMMIT-XTE | Updated new package tolerances dimensions A |
SPO-2013-PA-0002 | UT699 | UT699 Lock-up from async PCI RESET |
SPO-2013-PA-0003 | UT699 | Load Instruction with Data Tag Parity Error Errata |
SPO-2013-PCN-0003 | UT699 | Description of PCI timing paramters being added to the SMD |
SPO-2014-D-0001 | UT699 | Obsolescence notification for 300Krad(Si) RHA level on UT699 |
SPO-2014-PA-0004 | UT699 | GRFPU Floating Point Controller Store Forwarding Error |
SPO-2014-PA-0005 | UT699 | Instruction CACHE Controller Error do to HCACHE Timing |
SPO-2014-PA-0006 | UT699 | (SUPERSEDES) Load Instruction with Data Tag Parity Error Errata |
SPO-2014-PIN-0005 | UT699 | Changing device irradiated from 50-300 rads (Si)/s to effective dose rate = 1 rad (Si)/s |
SPO-2015-PIN-0001 | UT699 | Add device 02 irradiated from 50-300 rads (Si)/s to effective dose rate = 1 rad (Si)/s |
SPO-2016-PIN-0002 | UT699 UT699E UT700 |
This Product information notice is to notify user of Leon 3FT Stale Cache Entry After Store with Data Tag Parity Error |
SPO-2020-PA-0001 | UT699 UT699E UT700 |
FTMCTRL: Failing SDRAM Access After Uncorrectable EDAC Error |
SPO-2020-PA-0002 | UT699 UT699E UT700 |
LEON3/FT AHB Lock Release during Atomic Operation |
SPO-2020-PA-0003 | UT699 UT699E UT700 |
GRFPU Floating-point controller: Missing FDIV/FSQRT Result |
SPO-2020-PA-0004 | UT699 UT699E UT700 |
Leon3/FT AHB Deadlock After Sequence of Load and Atomic Instructions |
SPO-2020-PA-0005 | UT699 | LEON3FT RETT Restart Errata |
SPO-2018-PIN-0003 | UT8CR512K32 UT8ER512K32 UT8R512K8 Volatile Memory |
SMD/Datasheet corrections to include missing AC timing specs and edir VDD and VIO absolute max rating |
SPO-2020-D-0002 | UT8CR512K32 UT8R512K8 Volatile Memory (300 krad) |
Product discontinuance notice to announce the end of life (EOL) 300krad TID parts for SMD numbers 04227, 03235, and 03236 |
SPO-2015-PIN-0003 | UT8CR512K32 UT8ER1M32 UT8ER1M39 UT8ER2M32 UT8ER4M32 UT8ER512K32 UT8Q512E UT8Q512K32E UT8R128K32 UT8R2M39 UT8R4M39 UT8R512K8 UT9Q512E UT9Q512K32E |
Product Information Notice is to inform the industry about the Frontgrade SRAMs low power read architecture |
SPO-2015-AL-0001 | UT8ER1M32 UT8ER4M32 UT8ER512K32 UT8R1M39 UT8R2M39 UT8R4M39 |
An internal review determined Total Ionizing Dose (TID) testing bias circuit was limiting current when performing radiation testing to 100 krad(Si) per MIL-STD-883, M1019, Condition A. As a result of this finding, samples from previously delivered wafer |
SPO-2020-PA-0006D | UT8ER1M32 UT8ER2M32 UT8ER4M32 UT8R1M39 UT8R2M39 UT8R4M39 |
Group D Seam Seal failure of microcircuit, memory, digital, CMOS, radiation-hardened, dual-voltage SRAM, Multichip Module |
SPO-2012-PA-0002 | UT8ER1M32 | Corrected and New AC parameters for EDAC register access |
SPO-2012-PCN-0008 | UT8ER1M32 | SEE & Package drawing clarification |
SPO-2018-PA-0003 | UT8ER1M32 | UT8ER1M32S test escape. Whole block of the test program found to be commented out |
SPO-2018-PCN-0002 | UT8ER1M32 | Changes to package outline, VIL/VIH, and absolute maximum ratings. |
SPO-2013-PIN-0001 | UT8ER4M32 | Burn-in temperature reduction informational notice |
SPO-2018-PIN-0003 | UT8ER512K32 | SMD/Datasheet corrections to include missing AC timing specs and edir VDD and VIO absolute max rating |
SPO-2012-PA-0001 | UT8ER512K32 | Corrected and New AC parameters for EDAC register access |
SPO-2012-PCN-0007 | UT8ER512K32 | SEE Limits corrections |
SPO-2014-PA-0008 | UT8MR2M8 | UT8MR2M8 16M MRAMs Long Term Temperature Accelerated Random Single Bit Read Anomalies |
SPO-2019-D-0010 | UT8MR2M8 | DMSMS, discontiune for product type 01&02 and create type 03&04 that has cold probe |
SPO-2016-PIN-0001 | UT8MR8M8 | To notify users of QML grade UT8MR8M8 64M MRAMs of the Multi-Bit Error (MBE) detection pin behavior. |
SPO-2018-PIN-0001 | UT8Q512E UT9Q512E |
SMD/Datasheet corrections to include missing AC timing specs |
SPO-2019-D-0011 | UT8Q512E | DMSMS, discontiune for product type 05&06 and create type 07 for Rev F die |
SPO-2018-PIN-0002 | UT8Q512K32E UT9Q512K32E |
SMD/Datasheet corrections to include missing AC timing specs |
SPO-2019-D-0013 | UT8Q512K32E | DMSMS, discontiune for product type 02&03 and create type 04 for Rev F die |
SPO-2012-PCN-0009 | UT8R1M39 | SEE & Package drawing clarification and Pin Description correction |
SPO-2012-PCN-0010 | UT8R2M39 | SEE & Package drawing clarification and Pin Description correction |
SPO-2013-PIN-0002 | UT8R4M39 | Burn-in temperature reduction informational notice |
SPO-2018-PIN-0003 | UT8R512K8 | SMD/Datasheet corrections to include missing AC timing specs and edir VDD and VIO absolute max rating |
SPO-2013-PCN-0004 | UT8SDMQ64M40 | Correct the TLZ parameter |
SPO-2014-PA-0001 | UT8SDMQ64M40 | IBIS Model Inaccuracy |
SPO-2014-PIN-0001 | UT8SDMQ64M40 | Hold notification for 100Krad(Si) RHA level on 2.5Gb SDRAM |
SPO-2013-PCN-0005 | UT8SDMQ64M48 | Correct the TLZ parameter |
SPO-2014-PA-0002 | UT8SDMQ64M48 | IBIS Model Inaccuracy |
SPO-2014-PIN-0002 | UT8SDMQ64M48 | Hold notification for 100Krad(Si) RHA level on 3.0Gb SDRAM |
SPO-2017-D-0003 | UT9Q512E | End of Life announcement for SMD# 5962-00536 device 05 and 06 |
SPO-2018-PIN-0001 | UT9Q512E | SMD/Datasheet corrections to include missing AC timing specs |
SPO-2019-D-0012 | UT9Q512K32E | DMSMS, discontiune for product type 02&03 and create type 04 for Rev F die |
HYB-2018-PA-0001 | RHD Series | SMD and Datasheet Corrections - Hybrid Microcircuits RHD Series Product |
HYB-2018-D-0002 | RHD5903 RHD5904 RHD5905 RHD5906 RHD5907 RHD5938 |
Discontinuance of part numbers: RHD5903, RHD5904, RHD5905, RHD5906, RHD5907, RHD5938 |
HYB-2018-D-0001 | Analog Multiplexers (150 krad) | Obsolescence of 150 krad analog multiplexers |
SPO-2012-D-0008 | UT80CRH196KD UT80C196KD |
Last time buy notification for UT80CRH196KD/UT80C196KD |
SPO-2012-PIN-0001A | UT80CRH196KDS | EOL notice on diminished source of UT80CRH196KDS |
SPO-2019-D-0004 | Microcontrollers (98552) | DMSMS for all device types in 98552 |
SPO-2019-D-0005 | Microcontrollers (02523) | DMSMS for all device types in 02523 |
SPO-2019-D-0007 | Microcontrollers (95638) | DMSMS for all device types in 95638 |
SPO-2019-D-0006 | Microprocessors (01502) | DMSMS for all device types in 01502 |
SPO-2011-D-0001 | MIL-STD-1553 BCRTM | Last time buy and obsolescence notification for MIL-STD-1553 BCRTM |
SPO-2012-D-0001 | MIL-STD-1553 BCRT | Last time buy and obsolescence notification for MIL-STD-1553 BCRT |
SPO-2012-D-0006A | MIL-STD-1760 RTS | Last time buy notification for MIL-STD-1760 RTS |
SPO-2012-D-0007A | MIL-STD-1553 RTR | Last time buy notification for MIL-STD-1553 RTR |
SPO-2013-D-0001 | SuMMIT-LXE (12V &15V XCVRs) | Obsolescence notice for SuMMIT-LXE devices with 12V &15V XCVRs |
SPO-2013-PA-0004 | SpaceWire | SpW Transmission Stall from Small RCV FIFO |
SPO-2013-PCN-0007 | SpaceWire | Correct some AC timing parameters and add CCGA package option |
SPO-2014-PA-0003 | UT200SpW4RTR | Configuration access lockup on the UT200SpW4RTR Router |
SPO-2016-D-0001 | UT1553 RTMP | End of life announcement for SMD# 5962-88645, UT1553 RTMP |
SPO-2016-PCN-0001 | UT1553 RTMP | SMD# 5962-88645, UT1553 RTMP IIL and IIH limit change notification |
SPO-2012-PCN-0004A | 164646S | Skew parameter limit and notes changes to '164646S logic device |
SPO-2014-PIN-0004 | UT54ACS162245SLV | UT54ACS162245SLV Power Sequencing Guidelines |
SPO-2012-D-0005 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2012-PCN-0006 | UT54ACTS74E | UT54ACTS74E of device type 02 transfer from Fab 9 to Fab 10 |
SPO-2014-D-0003 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0004 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0005 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0006 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0007A | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0008A | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2017-PCN-0001 | MSI Logic | Update post irradiation QIDD for all Migrated RHMSI products |
SPO-2018-PCN-0003 | MSI Logic | All older 8-b RHMSI Logic parts: new spec.: input tr, tf (max.) |
SPO-2018-D-0001 | UT54ACTS240 UT54ACTS240E |
End of Life announcement for SMD# 5962-96569 device 01 |
SPO-2020-D-0004 | UT54ACTS220 | End of Life announcement for SMD# 5962-96753 |
SPO-2012-D-0009 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2012-D-0010 | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0009A | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2014-D-0010A | MSI Logic | Obsolescence and product migration notification for MSI logic device |
SPO-2016-PCN-0003 | 208CQFP | This Product change notice is for change to a package dimension for the 208CQFP (SMD case out line X) lead length (parameter D3) from .825" to .620" |
SPO-2019-D-0008 | Logic (Legacy) | DMSMS for all product offerings |
SPO-2020-D-0003 | UT6325 | EOL Notification for SMD 5962-04229 |
SPO-2020-D-0007 | UT22VP10 | End of Life announcement for SMD# 5962-94754, UT22VP10 Universal RADPAL |
SPO-2012-D-0003 | PROM (5V 64K) | Last time buy notification for 3V 64K PROM |
SPO-2012-D-0002 | PROM (5V 64K) | Last time buy notification for 5V 64K PROM |
SPO-2012-D-0004 | QCOTS SRAM MCM (3.3V 16MB) | Obsolescence notification for 3.3V 16Mb QCOTS SRAM MCM |
SPO-2019-D-0001 | Various | DMSMS for all device types in 99606 |
SPO-2017-D-0002 | UT8Q1024 | End of Life announcement for SMD# 5962-01532 device 01, UT8Q1024 |
SPO-2017-D-0001 | UT8Q512 | End of Life announcement for SMD# 5962-96607device 01-04, UT8Q512 |
SPO-2018-PIN-0003 | Volatile Memory | SMD/Datasheet corrections to include missing AC timing specs and edir VDD and VIO absolute max rating |
SPO-2020-D-0013A | Volatile Memory | Discontinuing product line due to lack of customer interest |
HYB-2017-PA-0001 | DC to DC Converters | Internal Gas Analysis Failures Hybrid Microcircuits DC-DC Converters |
SPO-2021-PA-0001A | UT8SDMQ64M40 UT8SDMQ64M48 |
Frontgrade Radiation-Hardened 2.5 AND 3.0GBit SDRAM MCM Non-conformance Advisory |
SPO-2021-PA-0002 | UT32M0R500 | Precision Current Source (PCS) Non-Conformance and PCS Specification Clarification |
SPO-2020-PIN-0001 | UT8SDMQ64M40 UT8SDMQ64M48 |
Addition of alternative burn-in conditions and reinstatement of RHA level “R” (100krad) for 2.5Gb and 3.0Gb SDRAM modules |
SPO-2021-PA-0003 | UT700 LEON 3FT | UT700 LEON3 FT SPARC V8 Microprocessor, 1553 peripheral transmission glitches on power-up sequence |
SPO-2021-PCN-0001 | UT200SpWPHY01 | Correction of absolute maximum specification - Power Dissipation Addition of TC and input signal rise/fall time guidelines to recommended operating conditions |
SPO-2021-PCN-0002 | UT8ER4M32M UT8ER4M32S |
Table 2 Device Option: Signal and Pin Description pinout was found to have errors for device option column UT8ER4M32M and UT8ER4M32S only. Pin 45 and 46 were listed as NC but should be E7# and E5# respectively. |
SPO-2021-PCN-0003 | UT8R4M39 | Correction to SMD, Figure 2. Terminal Connections UT8R4M39 4MEG x 39-Bit Dual Voltage SRAM MCM |
SPO-2021-PA-0004A | UT32M0R500XXXX | SMD# 5962-17212 ADC and I2C Functional Manual ERRATA |
SPO-2021-D-0003 | UT54LVDS031 UT54LVDS032 UT54LVDSC031 UT54LVDSC032 |
End of Life announcement for SMDs 5962-95833, 5962-95834; Device Types 02, 03 |
SPO-2021-D-0001 | UT8SDMQ64M40 | Discontinuations of device type 02 and addition of device type 03 for SMD 5962-10229 |
SPO-2021-D-0002 | UT8SDMQ64M48 | Discontinuations of device type 02 and addition of device type 03 for SMD 5962-10230 |
SPO-2020-D-0012 | UT54ACTS244 | Obsolescence and product migration notification for SMD #: 5962-96571, Device Type: 01 |
SPO-2021-D-0004 | UT8SDMQ64M40 | Removal of 100krad device offering due to exhausted die inventory |
SPO-2021-D-0005 | UT8SDMQ64M48 | Removal of 100krad device offering due to exhausted die inventory |
SPO-2019-D-0009 | UT8MR8M8 | End of life and replacement device notification for MRAM production due to process and qualification changes |
SPO-2019-PIN-0001 | UT8MR8M8 | This PIN adds new devices type 03 and 04 and describes the changes to the SMD due to process and qualification flow changes. This PIN also provides notification and correction of a requirement contained in the SMD |
SPO-2022-D-0001 | UT54ACS245S | Obsolescence of UT54ACS245S, SMD# 5962-96572 Device Type 02 Only |
SPO-2022-D-0002 | UT16MX110, UT16MX111, UT16MX112, UT16MX113, UT16MX114, UT16MX115, UT16MX116, UT16MX117 |
End of Life announcement |
SPO-2022-D-0003 | UT54BS3245, UT54BS16245, UT54BS16210, UT54BS32245, UT64BS1X433, UT32BS1X833 |
End of Life announcement |
SPO-2019-PCN-0001 | UT54BS3245 | Package Pinout Diagram Correction |
SPO-2022-PCN-0001 | UT65CML8X8FD | Package Pinout Diagram Correction |
SPO-2022-PIN-0001 | UT28F256LVQLE | VIL VIH guaranteed by design for certain address pins. |
SPO-2022-PIN-0002 | UT28F256QLE | VIL VIH guaranteed by design for certain address pins. |
SPO-2022-PA-0002 | UT8ER1M32S UT8ER2M32S UT8ER4M32S |
Notification of missing Pin Leakage Test |
SPO-2022-PCN-0002 | ALL Frontgrade LVDS Products | HBM ESD ratings added to Data Sheet (DS) and SMD documents |
SPO-2023-D-0001 | UT8SMDQ64M40 UT8SMDQ64M48 |
DIMINISHING MANUFACTURING SOURCES AND MATERIAL SHORTAGES |
SPO-2023-PCN-001 | UT04VS33P UT04VS50P |
VTH_VIN ELECTRICAL PARAMETERS AND TOL PIN DESCRIPTION CHANGE FOR YIELD ENHANCEMENT |
SPO-2023-PA-0003 | UT24CP1008 | SERDES functional capability limitation when channel 3 is used and PMA clock divider is set to >=2 |
SPO-2023-PA-0002 | UT32M0R500 | UT32M0R500 ARM MICROCONTROLLER: REPORTED SENSITIVITY IN STARTUP CIRCUITRY |
SPO-2024-D-0004 | UT8ER4M32 UT8ER1M32 |
OBSOLESCENCE NOTICE FOR MICROCIRCUIT, DIGITAL, CMOS, 4MEG X 32-BIT (128M) AND 1Meg X 32-BIT (32M), RADIATION-HARDENED, DUAL VOLTAGE SRAM with embedded EDAC, MULTICHIP MODULE (MASTER ONLY) |
SPO-2024-PA-0001 | UT69151E | NOTIFICATION OF MISSING JTAG PIN TDO TEST OF MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDNENED, MIL-STD-1553 SERIAL MICRO-CODED MONOLITHIC MULTI-MODE INTELLIGENT TERMINAL, MONOLITHIC SILICON |
SPO-2024-D-0001 | UT54ACTS273 | OBSOLESCENCE NOTICE FOR MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL D FLIP-FLOP WITH CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
SPO-2024-D-0002 | UT54ACTS191 | OBSOLESCENCE NOTICE FOR MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, SYNCHRONOUS 4-BIT UP/DOWN BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
SPO-2024-D-0003 | UT54ACS85/UT54ACTS85 | OBSOLESCENCE NOTICE FOR MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 4-BIT MAGNITUDE COMPARATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |